20 Pages Posted: 30 Apr 2024
Abstract
A simple method for visualizing the magnetic fields of any magnets and magnetized materials in a scanning electron microscope (SEM) is proposed. The essence of the method is to use an original magnetic field detector (G-detector, patent RU 218 180 U1 [1]) in the form of a plate, on the surface of which a special grid of non-magnetic material is made. The G-detector is located near the magnetized sample, and the electron beam scans the grid on the G-detector and the sample itself in a standard manner. The primary electron beam is deflected during scanning due to the Lorentz force, and the SEM image of the G-detector grid lines changes to reflect the influence of the sample's magnetic field. Scanning spatial resolution of up to 100 nm. The magnitude of the studied fields is from 0.001 T to 2 T. The method allows you to observe and video record dynamic changes in the magnetic field induction, . When applying the method, an effect was found anomalous anisotropy of changes in the trajectory of electrons in magnetic fields.